Our high precision, flexible and low inductance dynamic testers with easily swapable Measuring Unit
Dynamic tester checks each pulse, if the voltage, current and power levels are reached and flags any error immediately so faults can be caught before the device leaves the line.
Measuring Unit
DUT-specific connection with a customer specific DC link to minimise ESL and an individual gate-drive stage.
Measuring Unit has low stray inductance keeps the device under real stress during switching.
The whole unit can be exchanged quickly for different devices or maintenance purposes.
FET
Si / SiC / GaN
IGBT
Silicon (Si)
Bridges / Modules
Half Bridge, Full Bridge and Rectifiers
Die (KGD)
Si / SiC / GaN
Technical Details
These represent our standard specifications. We offer customer specific modifications to meet your exact testing requirements.
Software
Operating Software
Module Measuring Program Editor
Integrated Oscilloscope
Gallery
Lifecycle services
AutoCal
Software
Onsite Support
Trainings
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