Static Testers
Accurately record every electrical parameter under load, such as contact integrity, forward and breakdown voltages, leakage currents with compensation, RDS(on) / VCE(sat), threshold voltage, and thermal impedance.
We support power diodes and Si, SiC, and GaN modules, accommodating everything from bare chips to fully packaged devices with standalone or in-line handling capabilities.
Dynamic Testers
Double pulse tests (RBSOA) and short circuit tests (SCSOA) to test the switching performance and durability of Si, SiC and GaN modules. Our Dynamic tester features easily customer-specific measuring equipment and DC links. Provides a full hot-test capabilities in the laboratory or fully inline in production.
Inverter Testers
Inverter test solutions are currently in development.
Talk to us early about your application, target parameters and volumes. We will help you scope the right approach and keep you informed as the inverter tester becomes available.
Custom Solutions
Tailor-made systems for any test procedure. When one of our standard testers does not fit your requirements, we design the system around your specification, parameters and throughput for continuous quality control under extreme conditions.
Planning your next semiconductor tester?
Talk to our experts for professional guidance.